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Terao, Takeshi

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An a posteriori verification method for generalized real-symmetric eigenvalue problems in large-scale electronic state calculations
Authors Hoshi, Takeo/ Ogita, Takeshi/ Ozaki, Katsuhisa / Terao, Takeshi/
Content Type Journal Article
Journal Title Journal of Computational and Applied Mathematics
Volume 376
Published Date 2020-10-01
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