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Authors |
Mukai, Kotaro
Faculty of Sustainable Sciences Tottori University
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Keywords | biometrics
SVM
ultrasound
evoked brain wave
mutual feature between electrodes
reduction of SVM models
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Abstract | In user management, to realize continuous user authentication, we study the use of an electroencephalogram (EEG) evoked by ultrasound as biometrics. In previous studies, using a spectrum and four nonlinear quantities in EEG as individual features and a support vector machine (SVM) as a verification method achieved an equal error rate (EER) of 0 %. However, it required a large number of SVM models, wherein considerable amount of computation regarding learning was consumed. In this study, we introduce a mutual feature between electrodes and confirm its effectiveness in achieving EER = 0 % with a smaller number of SVM models.
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Publisher | IEEE
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Content Type |
Conference Paper
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ISBN | 9781665487696
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Journal Title | Proceedings of 2022 IEEE Symposium Series on Computational Intelligence (SSCI 2022)
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Start Page | 171
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End Page | 177
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Published Date | 2023-01-30
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Publisher-DOI | |
Text Version |
Author
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Rights | (C) 2022 IEEE
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Citation | I. Nakanishi and K. Mukai, "Introduction of a Mutual Feature between Electrodes into Support Vector Machine Based Person Verification Using Evoked Electroencephalogram by Ultrasound," 2022 IEEE Symposium Series on Computational Intelligence (SSCI), Singapore, Singapore, 2022, pp. 171-177, doi: 10.1109/SSCI51031.2022.10022272.
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Department |
Faculty of Engineering/Graduate School of Engineering
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Language |
English
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