{"created":"2023-08-02T03:54:38.372651+00:00","id":3482,"links":{},"metadata":{"_buckets":{"deposit":"83b21b5b-9c8c-432e-ab3c-eebeabd5776b"},"_deposit":{"created_by":10,"id":"3482","owners":[10],"pid":{"revision_id":0,"type":"depid","value":"3482"},"status":"published"},"_oai":{"id":"oai:repository.lib.tottori-u.ac.jp:00003482","sets":["1:10","2:14","23:39:708"]},"author_link":["33884","33885","33886","33887"],"item_3_alternative_title_31":{"attribute_name":"タイトル（ヨミ）","attribute_value_mlt":[{"subitem_alternative_title":"メスバウアー　コウカ　ノ　ソクテイジョウケン　Ⅰ : トクニ　コウホウサンランホウ　ニ　ツイテ","subitem_alternative_title_language":"ja-Kana"}]},"item_3_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1970-12-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"84","bibliographicPageStart":"79","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"鳥取大学工学部研究報告","bibliographic_titleLang":"ja"},{"bibliographic_title":"Reports of the Faculty of Engineering, Tottori University","bibliographic_titleLang":"en"}]}]},"item_3_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Mossbauer effect has been applied in many fields of solid state physics and chemistry and usually the experiments were carried out by absorption method. On the other hand backscatter method was not used so commonly because of its experimental difficulties. However the method has many advantages in studying solid surfaces. In the present paper the measurement procedure of the backscatter method is discussed.","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"鳥取大学工学部"}]},"item_3_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"鳥取大学工学部研究報告. 1970, 1(1), 79-84"}]}]},"item_3_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"注があるものを除き、この著作物は日本国著作権法により保護されています。 / This work is protected under Japanese Copyright Law unless otherwise noted."}]},"item_3_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00174610","subitem_source_identifier_type":"NCID"}]},"item_3_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03858596","subitem_source_identifier_type":"ISSN"}]},"item_3_text_32":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"電子工学科"},{"subitem_text_value":"電子工学科"}]},"item_3_text_33":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electronics"},{"subitem_text_language":"en","subitem_text_value":"Department of Electronics"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"原田, 久将"},{"creatorName":"ハラダ, ヒサマチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"33884","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"加藤, 益"},{"creatorName":"カトウ, ススム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"33885","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Harada, Hisamochi","creatorNameLang":"en"},{"creatorName":"ハラダ, ヒサマチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"33886","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kato, Susumu","creatorNameLang":"en"},{"creatorName":"カトウ, ススム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"33887","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"メスバウアー効果の測定条件Ⅰ : 特に後方散乱法について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"メスバウアー効果の測定条件Ⅰ : 特に後方散乱法について","subitem_title_language":"ja"},{"subitem_title":"Measurement Conditions of Mossbauer Effect Ⅰ : Backscatter Method","subitem_title_language":"en"}]},"item_type_id":"3","owner":"10","path":["14","10","708","1712112934794"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2018-12-26"},"publish_date":"2018-12-26","publish_status":"0","recid":"3482","relation_version_is_last":true,"title":["メスバウアー効果の測定条件Ⅰ : 特に後方散乱法について"],"weko_creator_id":"10","weko_shared_id":-1},"updated":"2024-04-03T05:35:33.054788+00:00"}