{"created":"2023-08-02T03:57:54.063041+00:00","id":7022,"links":{},"metadata":{"_buckets":{"deposit":"2503d791-b256-4e33-aed7-c4c220e65201"},"_deposit":{"created_by":10,"id":"7022","owners":[10],"pid":{"revision_id":0,"type":"depid","value":"7022"},"status":"published"},"_oai":{"id":"oai:repository.lib.tottori-u.ac.jp:00007022","sets":["1:10","2:15"]},"author_link":["2512","26065","4631","415","26066"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"5416","bibliographicPageStart":"5413","bibliographic_titles":[{"bibliographic_title":"IEEE International Symposium on Circuits and Systems proceedings 2005 (ISCAS2005)"},{"bibliographic_title":"IEEE International Symposium on Circuits and Systems proceedings 2005 (ISCAS2005)","bibliographic_titleLang":"en"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper presents a multi-matcher on-line signature verification system which fuses the verification scores in pen-position parameter and pen-movement angle parameter at decision level. Features of pen-position and pen-movement angle are extracted by the sub-band decomposition using the Discrete Wavelet Transform (DWT). In the pen-position, high frequency sub-band signals are considered as individual features to enhance the difference between a genuine signature and its forgery. On the other hand, low frequency sub-band signals are utilized as the features for suppressing the intra-class variation in the penmovement angle. Verification is achieved by the adaptive signal processing using the extracted features. Verification scores in the pen-position and the pen-movement angle are integrated by using a weighted sum rule to make total decision. Experimental results show that fusion of pen-position and pen-movement angle can improve verification performance.","subitem_description_type":"Other"}]},"item_10003_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_10003_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/ISCAS.2005.1465860","subitem_relation_type_select":"DOI"}}]},"item_10003_relation_16":{"attribute_name":"情報源","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"IEEE International Symposium on Circuits and Systems proceedings 2005 (ISCAS2005). 2005, 5413-5416"}]}]},"item_10003_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://ieeexplore.ieee.org/abstract/document/1465860/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://ieeexplore.ieee.org/abstract/document/1465860/","subitem_relation_type_select":"URI"}}]},"item_10003_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new coll"}]},"item_10003_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10453415","subitem_source_identifier_type":"NCID"}]},"item_10003_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"02714302","subitem_source_identifier_type":"ISSN"}]},"item_10003_text_32":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Faculty of Regional Sciences, Tottori University"},{"subitem_text_value":"Faculty of Engineering, Tottori University"},{"subitem_text_value":"Faculty of Engineering, Tottori University"},{"subitem_text_value":"Faculty of Engineering, Tottori University"}]},"item_10003_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nakanishi, Isao"},{"creatorName":"ナカニシ, イサオ","creatorNameLang":"ja-Kana"},{"creatorName":"Nakanishi, Isao","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Sakamoto, Hiroyuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Itoh, Yoshio"},{"creatorName":"Itoh, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Fukui, Yutaka"},{"creatorName":"Fukui, Yutaka","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Sakamoto, Hiroyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-05-11"}],"displaytype":"detail","filename":"ISCAS2005_5413.pdf","filesize":[{"value":"339.4 kB"}],"format":"application/pdf","licensefree":"© 2005 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new coll","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"ISCAS2005_5413.pdf","url":"https://repository.lib.tottori-u.ac.jp/record/7022/files/ISCAS2005_5413.pdf"},"version_id":"ec9bb710-d339-4499-9bcd-d2d21db552d1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper"}]},"item_title":"DWT Domain Multi-matcher On-line Signature Verification System","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DWT Domain Multi-matcher On-line Signature Verification System","subitem_title_language":"en"}]},"item_type_id":"10003","owner":"10","path":["10","15"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2018-06-22"},"publish_date":"2018-06-22","publish_status":"0","recid":"7022","relation_version_is_last":true,"title":["DWT Domain Multi-matcher On-line Signature Verification System"],"weko_creator_id":"10","weko_shared_id":-1},"updated":"2023-09-28T07:58:58.423975+00:00"}